Elemental Analysis by XRF
X-ray Fluorescence (XRF) is a non-destructive analytical technique used for determining the elemental composition of materials. These methods are widely applied in industrial quality control, environmental monitoring, and research.
Specifications
Vanta XRF analyzer specifications
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Specifications |
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Dimensions (W×L×H) |
8.3cm × 24.2cm × 28.9cm (3.26in. × 9.5in. × 11.4in.) |
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Weight |
Vanta L, C, and M — 1.48kg (3.25lb) [base wt.]; 1.70kg (3.75lb) with battery Vanta Element series — 1.32kg (2.90lb) [base wt.]; 1.54kg (3.40lb) with battery |
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Excitation source |
4-watt X-ray tube — Ag, Rh, or W anode (application optimized) 5–200µA VMR, VMW, VCA, Vanta Element-S: 8–50keV VCR and VCW: 8–40keV VLW, Vanta Element: 8–35keV |
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Primary beam filtration |
Eight automatically selected filter positions per beam per method (VLW and Vanta Element are equipped with a single fixed filter) (Vanta Element-S is equipped with a 4-position wheel) |
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Detector |
M series: Large area silicon drift detector C series, Vanta Element-S: Silicon drift detector L series and Vanta Element: Si PIN detector |
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Power |
Removable Li-ion batteries or 18V AC power adaptor unit |
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Elemental range |
VMR, VCR, VCA Vanta Element-S = Mg–U; VMW, VCW = Al–U; VLW and Vanta Element = Ti–U |
Our Services
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Alloy composition measurement of metal samples
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Scrap metal testing
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On-site soil testing
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Positive material identification (PMI) and alloy analysis
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Food safety analysis (Foreign body identification, heavy metal identification in food products, poultries and fisheries)
Test Rates
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Test Name |
Cost of the test (MIST students and Faculty) (in BDT) |
Cost of the test |
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Elemental Analysis using portable XRF |
2000 |
5000 |
Query (For Appointment)
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Lab In-Charge: Mosharat Belal Tahia (Lecturer)
Contact: +8801521726686
Email: tahia@nse.mist.ac.bd
- Program Coordinator: Lt. Cdr. Tamanna Islam Eti
Contact: +8801769024176